| * |
C. Falldorf, S., Huferath-von Luepke, C., v. Kopylow, R. B., Bergmann, "Reduction of speckle noise in multi wavelength contouring", Applied Optics 51, 8211-8215 (2012) |
| * |
S. Huferath-von Lüpke, P., Huke, C., v. Kopylow, R. B., Bergmann, "Wear recording at micro deep drawing tools with comparative digital holography", J. Europ. Opt.Soc. Rap. Public 7, 12041-1-7 (2012) |
| * |
R. Grunwald, M. Bock, V. Kebbel, S. Huferath, U. Neumann, G. Steinmeyer, G. Stibenz, J.-L. Néron, and M. Piché, "Ultrashort-pulsed truncated polychromatic Bessel-Gauss beams", Opt. Exp. 16, 2, 1077-1089 (2008) |
| * |
R. Grunwald, S. Huferath, M. Bock, U. Neumann, and S. Langer, "Angular tolerance of Shack-Hartmann wavefront sensors with microaxicons", Opt. Lett. 32, 1533-1535 (2007) |
| * |
A. de Ugarte Postigo, A.J. Castro-Tirado, J. Gorosabe, G. Jóhannesson , G. Björnsson, E.H. Gudmundsson, M. Bremer, S. Pak, N. Tanvir, J.M. Castro Cerón, S. Guzyi, M. Jelínek, S. Klose, D. Pérez-Ramírez, J. Aceituno, A. Campo Bagatín, S. Covino, N. Cardiel, T. Fathkullin, A.A. Henden, S. Huferath, Y. Kurata, D. Malesani, F. Mannucci, P. Ruiz-Lapuente, V. Sokolov, U. Thiele, L. Wisotzki, L.A. Antonelli, C. Bartolini, A. Boattini, A. Guarnieri, A. Piccioni, G. Pizzichini, M. del Principe, A. di Paola, D. Fugazza, G. Ghisellini, L. Hunt, T. Konstantinova, N. Masetti, E. Palazzi, E. Pian, M. Stefanon, V. Testa, and P. J. Tristram, "GRB021004 modelled by multiple energy injections", A&A 443, 841–849 (2005) |
| * |
D. Weimer, S. Huferath-von Luepke, A. Tausendfreund, R. B. Bergmann, G. Goch, B. Scholz-Reiter, "Dimensional Quality Inspection of Metallic Micro Components in Micro Bulk Manufacturing", Advanced Materials Research Vol. 1018, TransTechn Publications Switzerland, 493-500 (2014) |
| * |
S. Huferath-von Luepke, R. B., Bergmann, "Digital holography for inline wear recording on deep drawing tools", Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014), Bremen, 08.-10.07.2014 (CD-Rom) |
| * |
M. Schröder, S. Huferath-von Luepke, M. Bülters, R. B. Bergmann, "Fabrication of 3d-microstructures for calibration of a holographic metrology system", Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014), Bremen, 08.-10.07.2014 (CD-Rom) |
| * |
D. Weimer, S. Huferath-von Luepke, C. Falldorf, M. Lütjen, A. Tausendfreund, Th. Kreis, A. von Freyberg, R. B. Bergmann, G. Goch, B. Scholz-Reiter, "A Comparison of in-situ Measuring Systems within Micro Cold Forming", Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014), Bremen, 08.-10.07.2014 (CD-Rom) |
| * |
S. Huferath-von Luepke, T. Baumbach, E. Kolenovic, C. Falldorf, C. v. Kopylow, "Digital Alignment of a reconstructed Hologram for Measurement of Deterioration of Tools", 36th International MATADOR Conference, eds.: S. Hinduja, L. Li. Springer Verlag London, 331-334 (2010) |
| * |
S. Huferath-von Luepke, R. Klattenhoff, C. Dankwart, C. Falldorf, R. B. Bergmann, "Complete shape measurement of micro parts by digital holography", Interferometry XVII: Techniques and Analysis, eds.: K. Creath, J. Burke, J. Schmit., Proc. of SPIE Vol. 9203, SPIE Bellingham, 920302-1-8 (2014) |
| * |
S. Huferath-von Luepke, E. N., Kamau, Th., Kreis, C., v. Kopylow, "Single shot multi wavelength shape measurements with restricted aperture", Interferometry XVI: Techniques and Analysis, eds.: J. Schmit, K. Creath, C. E. Towers, J. Burke., in: Proc. of SPIE Vol. 8493, SPIE Bellingham, 84930V-1-8 (2012) |
| * |
S. Huferath-von Luepke, U. Zuch, P. Huke, C. v. Kopylow, R. B., Bergmann, "Comparative digital holographic microscope for wear detection at micro deep drawing tools", EOS Annual Meeting Aberdeen, ISBN 978-3-9815022-4-4 (2012) (CD Rom) |
| * |
S. Huferath-von Luepke, P. Huke, C. von Kopylow, R.B. Bergmann, "Wear recording at micro deep drawing tools with comparative digital holography", Proceedings 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (2011) (CD-ROM) |
| * |
Z. Hu, S. Huferath-von Luepke, C. v. Kopylow, F. Vollertsen, "Characteristics of wear behavior of micro deep drawing tools", Proceedings of International Conference on Advance in Materials and Processing Technologies (AMPT 2010), eds.: F. Chinesta, Y. Chastel, M. El Mansori. AIP Melville New York, 335-340 (2010) (online) |
| * |
S. Huferath-von Luepke, C. v. Kopylow, J. Geldmacher, Th. Kreis, "Digital holographic recording using spatially resolved multi wavelength", Optical Data Storage, eds.: S. Orlic, R. Katayama., Boulder, USA, SPIE, in: Proc. SPIE Vol. 7730, 773005-1-9 (2010) |
| * |
T. Meeser, S. Huferath-von Luepke, Th. Kreis, "Digital holographic recording of large scale objects for metrology and display", Fringe 2009: The 6th International Workshop on Advanced Optical Metrology, eds.: W. Osten, M. Kujawinska., Springer Heidelberg, in: Fringe 2009, 501-504 (2009) |
| * |
S. Huferath-von Luepke, M. Bock, R. Grunwald, "Adaptive Bessel-autocorrelaton of ultrashort pulses with phase-only spatial light moldulators", Modelling Aspects in Optical Metrology II, eds.: H. Bosse, B. Bodermann, R. M. Silver., SPIE Bellingham, Munich, in: Proc. SPIE Vol. 7390, 73900B1-73900B8 (2009) |
| * |
R. Grunwald, M. Bock, S. Huferath-von Luepke, "Smart spatio-temporal beam shaping with thin-film microoptics", Laser Beam Shaping IX Conference, eds.: Andrew Forbes; Todd E. Lizotte, SPIE, San Diego, USA, (Keynote Lecture); in: Proc. SPIE Vol. 7062, 706202-706202-10 (2008) |
| * |
S. Huferath-von Luepke, V. Kebbel, M. Bock, and R. Grunwald, "Noncollinear autocorrelation with radially symmetric nondiffracting beams", Advanced Metrology Conference, eds.: Andrew Forbes, Todd E. Lizotte, SPIE, San Diego, USA, in: Proc. SPIE 7063, 706311-706311-12 (2008) |
| * |
R. Grunwald, M. Bock, S. Huferath, S. K. Das, S. Osten, P. Staudt, and G. Stibenz, Programmable ultrashort-pulse localized waves, PIERS Progress in Electromagnetics Research Symposium, Cambridge, USA, 2-6 July, 2008, Workshop on Localized Waves, Abstracts, 533-534 (2008) (CD-ROM) |
| * |
R. Grunwald, S. Huferath, M. Bock, "Robust Shack-Hartmann wavefront sensing with ultraflat microaxicons", Modeling Aspects in Optical Metrology, eds.: Harald Bosse; Bernd Bodermann; Richard M. Silver, SPIE, Munich, June 18-21, 2007, in: Proc. SPIE Vol. 6617, 661701-661713 (2007) |
| * |
S. Huferath-von Luepke, R. Klattenhoff, C. Dankwart, C. Falldorf, R. B. Bergmann, "Complete shape measurement of micro parts by digital holography", SPIE Interferometry XVII: Techniques and Analysis, San Diego, USA, August 2014 |
| * |
S. Huferath-von Luepke, M. Schröder, P. Huke and R. B. Bergmann, "Calibration of a digital holographic microscope for wear detection", nanoMan2014, Bremen, Germany, 10 Juli 2014
|
| * |
S. Huferath-von Luepke, U. Zuch, P. Huke, C. v. Kopylow, R. B., Bergmann, "Comparative digital holographic microscope for wear detection at micro deep drawing tools", EOS Annual Meeting, Aberdeen, GB, Oktober 2012 |
| * |
S. Huferath-von Luepke, E. N., Kamau, Th., Kreis, C., v. Kopylow, "Single shot multi wavelength shape measurements with restricted aperture", SPIE Interferometry XVI: Techniques and Analysis, San Diego, USA, August 2012 |
| * |
S. Huferath-von Luepke, P. Huke, C. von Kopylow, Ralf B. Bergmann, "Wear recording at micro deep drawing tools with comparative digital holography", 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, Bremen, Germany, 9. Dezember 2011, Bremen |
| * |
S. Huferath-von Luepke, T. Baumbach, E. Kolenovic, C. Falldorf, C. v. Kopylow, "Digital Alignment of a reconstructed Hologram for Measurement of Deterioration of Tools", 36th International MATADOR Conference, Manchester, GB, Juli 2010 |
| * |
I.V. gehalten: N. Wang, C. v. Kopylow, C. Falldorf, "Rapid shape measurement of micro deep drawing parts by means of digital holographic contouring", 36th International MATADOR Conference, Manchester, GB, Juli 2010 |
| * |
S. Huferath-von Luepke, C. v. Kopylow, J. Geldmacher, Th. Kreis, "Digital holographic recording using spatially resolved multi wavelength", Optical Data Storage, Mai 2010 |
| * |
S. Huferath-von Luepke, V. Kebbel, M. Bock, R. Grunwald, "Simulation of pulsed Bessel-like beams", Laser Optics Berlin, Berlin, Germany, Februar 2010 |
| * |
S. Huferath-von Luepke, M. Bock, R. Grunwald, "Adaptive Bessel-autocorrelaton of ultrashort pulses with phase-only spatial light moldulators", SPIE Europe - Modelling Aspects in Optical Metrology II, München, Germany, 2009 |
| * |
S. Huferath-von Luepke, V. Kebbel, M. Bock, and R. Grunwald, "Noncollinear autocorrelation with radially symmetric nondiffracting beams", Optical Engineering + Applications, San Diego, USA, 12. August 2008 |
| * |
S. Huferath, R. Grunwald, M. Bock, "Robust Shack-Hartmann wavefront sensing with ultraflat microaxicons", SPIE Europe Optical Metrology, München, Germany, 18. Juni 2007 |
| * |
S. Huferath, R. Grunwald, M. Bock, "Axicon-based Shack-Hartmann sensors for extreme parameters", Young Scientists International Workshop, Laser Laboratorium Goettingen, Germany, 26. April 2007 |
